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Accueil du site > Productions Scientifiques > Publications > A comparative investigation of the damage build-up in GaN and Si during rare earth ion implantation
A comparative investigation of the damage build-up in GaN and Si during rare earth ion implantation
par - 7 mars 2008
Gloux F., Ruterana P., Lorenz K., Alves E.
Physica Status Solidi A-Applications And Materials Science 205 (2008) 68-70
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