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Publications PM2E 2015

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  • 1. Structural analysis of strained LaVO3 thin
    films
    , H Rotella, O Copie, G Steciuk, H Ouerdane, P Boullay, P Roussel, M Morales, A David, A Pautrat, B Mercey, L Lutterotti,
    D Chateigner and W Prellier, J. Phys. : Condens. Matter 27, 175001 (9pp) (2015) doi:10.1088/0953-8984/27/17/175001

  • 2. Electrical properties of extended defects in III-Nitrides , A. Minj, D. Cavalcoli, G. Mutta Rani , A. Vilalta-Clemente , P. Ruterana and A. Cavallini, Acta Materialia 89, 29 (2015) doi:10.1016/j.actamat.2015.01.061

  • 3. Rare earth ion implantation and optical activation in nitride semiconductors for multicolor emission , P. Ruterana, M-P. Chauvat, and K. Lorenz, Semicond. Sci. Technol. 30, 044004 (2015) doi:10.1088/0268-1242/30/4/044004

  • 4. An efficient and automated 3D FE approach to evaluate effective elastic properties of overlapping random fibre composites ,W. Leclerc, P. Karamian, A. Vivet, Comput. Mater. Sci. 99, 1-15 (2015) doi:10.1016/j.commatsci.2014.10.047

  • 5. Improvement by carbon nanofibers of load transfer in carbon fiber reinforced composites , A. Vivet, B. Ben Doudou, C. Poilâne, J. Chen, M. Ayachi, Fibers, Special Issue Carbon Fibers 3, 134-150 (2015) doi:10.3390/fib3020134
  • 6. Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis , B. Caby, F. Brigidi, D. Ingerle, E.Nolot, G. Pepponi, C. Streli, L. Lutterotti, P. Gergaud, M. Morales, D. Chateigner, Spectrochimica Acta Part B : Atomic Spectroscopy 113, 132 (2015) doi:10.1016/j.sab.2015.09.008
  • 7. Analyse des textures cristallographiques et des microstructures.
    Thierry Baudin, Daniel Chateigner, Claude Esling, Luca Lutterotti, Magali Morales.
    Reflets de la Physique 44-45 (2015), 80-85.
  • 8. Dielectric analysis of the interfacial polarization of alkali treated woven flax fibers reinforced epoxy composites.
    A Triki, M Karray, C Poilâne, P Picart, M Gargoury.
    J. Electrost. 76 (2015), 67-72.
  • 9. Combination of electron energy-loss spectroscopy and energy dispersive X-ray spectroscopy to determine indium concentration in InxGa1-xN thin film structures., X. Wang, M. P. Chauvat, P. Ruterana and T. Walther, Semicond. Sci. Technol. 30, 044004(2015)

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