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Accueil du site > Productions Scientifiques > Publications > High rectifying behavior in Al/Si nanocrystal-embedded SiOxNy/p-Si heterojunctions
High rectifying behavior in Al/Si nanocrystal-embedded SiOxNy/p-Si heterojunctions
par - 22 mars 2011
Jacques E., Pichon L., Debieu O., Gourbilleau F., Coulon N.
Semiconductor Science and Technology 26 (2011) 055005
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