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Accueil du site > Productions Scientifiques > Publications > Interaction of swift ion beams with surfaces : Sputtering of secondary ions from LiF studied by XY-TOF-SIMS
Interaction of swift ion beams with surfaces : Sputtering of secondary ions from LiF studied by XY-TOF-SIMS
par - 8 avril 2011
Hijazi H., Rothard H., Boduch P., Alzaher I., Ropars F., Cassimi A., Ramillon J.M., T. Been T., Ban d’Etat B., Lebius H., Farenzena L.S., da Silveira E.F.
Nuclear Instruments and Methods in Physics Research B 269 (2011) 1003–1006
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