par- 23 août 2012
Professeur Lee CHOW
Department of Physics, Advanced Materials Processing and Analysis Center
University of Central Florida, Orlando
Vendredi 27 mai 2011 à 14h / Salle de réunion CIMAP-SUD
In the last 15 years, focused ion beam (FIB) instrument has gained widespread recognition as an important tool for nanoscience and nanotechnology research. Modern FIB instrument combined the focused ion beam column with a scanning electron microscope column and a gas delivery nozzle, becomes one of the most versatile tools in a material research laboratory for (a) material removal (sputtering), (b) material deposition, and (c) imaging applications. In this talk, I will describe the FIB fabrication of carbon nanotube devices (CNT) and ZnO nanodevices. We will discuss in general the challenges and difficulties we are facing with and the techniques we used to overcome these challenges. A new configuration of CNT that enable us to carry out FIB fabrication of CNT devices without damaging to the CNT will be described.
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