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Microstructurale

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To analyze the materials that it manufactures and studies, the CIMAP has established a panel of technology advanced microstructural characterization.

Polishing machine
PIPS Gatan
PIPS II Gatan for TEM preparation sample
ARM JEOL
ARM JEOL 200 kV equipped with an EELS (Gatan).
Focused Ion Beam
AFM / MFM / EFM / Microscope
AFM microscope working in tapping or contact modes. EFM / MFM / Tunnel Modes are available.
Fourrier Transformed Infra Red Spectroscopy
FTIR setup working in transmission or ATR modes