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To analyze the materials that it manufactures and studies, the CIMAP has established a panel of technology advanced microstructural characterization.

Polishing machine
PIPS Gatan
PIPS II Gatan for TEM preparation sample
ARM JEOL 200 kV equipped with an EELS (Gatan).
Focused Ion Beam
AFM / MFM / EFM / Microscope
AFM microscope working in tapping or contact modes. EFM / MFM / Tunnel Modes are available.
Fourrier Transformed Infra Red Spectroscopy
FTIR setup working in transmission or ATR modes